OPTIMESS
Optical Measurements Techniques
for Structures & Systems

 

Scientific Research Network Supported by the

FWO Vlaanderen

 

 

 

Pictures of the Workshop

 

Book of abstracts

 

OPTIMESS Workshop

When: Tuesday 12 October 2004

Where: VUB, Promotiezaal, room D2.14

 

Program:

9u45 – 10u00u

Welcome

10u00 – 11u00

Keynote presentation

Modern methods of NDE

Prof. Gerd Büsse, Dept. IKP-FZP, University of Stuttgart

Additional information on the subject (papers + references) can be found here.

11u00 – 11u15

Coffee break

11u15 – 11u35

Macro- and meso-scale optical strain measurement for deformability characterization of textile reinforcements

An Willems, Stepan Lomov, Zhu Yingbo, Dept. PMA and MTM, KU Leuven

11u35 – 11u55

Material and defect characterization by laser ultrasonics

Nikolaas Van Riet, Jozefien Goossens and Christ Glorieux Laboratorium voor Akoestiek en Thermische Fysica, KULeuven.

11u55 – 12u15

Characterizing the evolution of shear band patterns by digital image correlation of optical micrographs

Sven Bossuyt, Hugo Sol, Dept. MEMC, VUB

12u15 – 12u35

The digital image correlation technique as full field strain technique on biaxial loaded composites using cruciform specimens

Arwen Smits, D. Van Hemelrijck, T. Philippidis, A. M. van Wingerde Dept. MEMC, VUB; University of Patras; Knowledge Center WMC

12u35 – 14u00

LUNCH

14u00 – 15u00

Keynote presentation

The Challenge of Optical Full-Field Measurement Methods in Experimental Mechanics

Prof. Alain Vautrin, Ecole des Mines Saint-Etienne

15u00 – 15u15

Coffee Break

15u15 – 15u35

Dual channel heterodyne interferometer

H.J. van Elburg, J.J.J. Dirckx, W.F. Decraemer, Biomedical Physics Research Lab., University of Antwerp,

15u35 – 15u55

Full-field optical techniques within masonry research

Roald Hayen, Department of Building Materials, KU Leuven

15u55 – 16u15

Visualizing noise and flow using a Laser Doppler Vibrometer

Joris Vanherzeele, Dept. Mechanical Engineering, VUB

16u15 – 16u35

Identification of elastic isotropic material parameters based on ESPI measurements

David Lecompte, Hugo Sol , KMS; Dept MEMC, VUB